DocumentCode
1664485
Title
An Open Modular Test Concept for the DSP KISS-16V2
Author
PreiBner, J. ; Mahlich, G. ; Schuck, James ; Sahm, Hans ; Weingart, P. ; Weinsziehr, D.
fYear
1992
Firstpage
678
Keywords
Automatic testing; Circuit testing; Computer aided instruction; Concurrent computing; Digital signal processing; Digital signal processing chips; GSM; Hardware; Read only memory; Registers;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1992. Proceedings., International
ISSN
1089-3539
Print_ISBN
0-7803-0760-7
Type
conf
DOI
10.1109/TEST.1992.527889
Filename
527889
Link To Document