Title :
Functional Testing of Current Microprocessors (applied to the Intel i860)
Author :
vandeGoor, A.J. ; Verhallen, Th J W
Keywords :
Automatic testing; Built-in self-test; Ducts; Logic testing; Memory management; Microprocessors; Programming profession; Registers; Technology management; Very large scale integration;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527890
