Title :
Nonlinear distortions in SC-integrators due to nonideal switches and amplifiers
Author :
Robertini, Alessandro ; Goette, Josef ; Guggenbühl, Walter
Author_Institution :
Electron. Lab., Swiss Fed. Inst. of Technol., Zurich, Switzerland
Abstract :
An investigation is made of the nonlinear distortions that arise in high-frequency MOS SC (switched-capacitor) circuits due to the slewing of the amplifiers and the nonlinear resistances of the MOS-transistor switches. Simple models for the switches and the amplifiers are developed and applied to determine the resulting distortions in a commonly used SC integrator. The results are the basis for investigating more complex circuits that use the integrator as a building block
Keywords :
MOS integrated circuits; electric distortion; integrating circuits; semiconductor device models; semiconductor switches; switched capacitor networks; MOS-transistor switches; SC-integrators; amplifier slew; high frequency MOS SC circuits; models; nonideal switches; nonlinear distortions; nonlinear resistances; Capacitors; Charge transfer; Current measurement; MOSFETs; Nonlinear distortion; Parasitic capacitance; Piecewise linear approximation; Semiconductor device modeling; Switches; Voltage;
Conference_Titel :
Circuits and Systems, 1989., IEEE International Symposium on
Conference_Location :
Portland, OR
DOI :
10.1109/ISCAS.1989.100690
