Title :
A digitally stabilized type-III PLL using ring VCO with 1.01psrms integrated jitter in 65nm CMOS
Author :
Sai, Akihide ; Kobayashi, Yuka ; Saigusa, Shigehito ; Watanabe, Osamu ; Itakura, Tetsuro
Author_Institution :
Toshiba, Kawasaki, Japan
Abstract :
The design of low-jitter VCO-based PLLs is quite challenging as high VCO control gain, KVCO, increases the phase noise contribution arising from the charge pump and loop filter. To resolve this problem, dual-tuning PLLs (DT-PLLs) have been studied [1-4]. The DT-PLL structure adds a narrow-bandwidth coarse (high-KVCO) path to the fine (low-KVCO) path consisting of a type-II PLL. The narrow-bandwidth analog filter in the coarse path plays an important role in preventing the charge pump and the loop filter from increasing the output jitter, while a wide-tuning range is maintained. Moreover, the coarse path adds another pole at origin to the fine path and transforms it from a type-II to type-III PLL [3-4]. Compared to a type-II PLL, owing to its boosted low-frequency loop gain, a type-III PLL can better suppress a low-frequency disturbance to the ring VCO, such as temperature drift. However, a type-III PLL has stability problems. To ensure sufficient phase margin (PM), a type-III PLL requires an extremely narrow-bandwidth (e.g. ~10-100Hz) analog filter in the coarse path or must make the KVCO of the fine path larger. The former requires a nano-Farad capacitor or a fairly complex design for shrinking the capacitance, while the latter way increases total jitter. This paper presents a digitally stabilized type-Ill PLL with a ring VCO. It employs a DT-PLL structure and improves its stability by composing the coarse path with a digital integrator and a digital-to-analog converter (DAC). It can set the Kvco of the fine path to 10MHz/V, which is 1000χ lower than that of the coarse path with a sufficient PM. For further in-band phase-noise reduction, the proposed type-Ill PLL adopts a sub-sampling PLL (SS-PLL) in its fine path [5], and achieves 1.01 psrms integrated jitter.
Keywords :
CMOS integrated circuits; charge pump circuits; circuit stability; circuit tuning; digital-analogue conversion; integrated circuit noise; jitter; phase locked loops; phase noise; voltage-controlled oscillators; CMOS; DAC; DT-PLL structure; VCO control gain; charge pump; digital integrator; digital-to-analog converter; digitally stabilized type-III PLL; dual-tuning PLL; in-band phase-noise reduction; integrated jitter; loop filter; low-frequency disturbance; low-frequency loop gain; low-jitter VCO-based PLL; narrow-bandwidth analog filter; narrow-bandwidth coarse; output jitter; phase margin; phase noise contribution; ring VCO; size 65 nm; stability; subsampling PLL; temperature drift; wide-tuning range; Frequency measurement; Jitter; Phase locked loops; Phase noise; Solid state circuits; Transient analysis; Voltage-controlled oscillators;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2012 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4673-0376-7
DOI :
10.1109/ISSCC.2012.6176996