1665715

Transition fault simulation for sequential circuits

Cheng, Kwang-Ting

1995

723

CMOS logic circuits; Circuit faults; Circuit simulation; Circuit testing; Clocks; Combinational circuits; Delay; Semiconductor device modeling; Sequential analysis; Sequential circuits;

English

ieee

Test Conference, 1992. Proceedings., International

Baltimore, MD

1089-3539

0-7803-0760-7

conf

10.1109/TEST.1992.527894

527894