• DocumentCode
    1665757
  • Title

    A digital calibration technique for pipelined analog-to-digital converters

  • Author

    Furuta, Masanori ; Kawahito, Shoji ; Miyazaki, Daisuke

  • Author_Institution
    Graduate Sch. of Electron. Sci. & Technol., Shizuoka Univ., Japan
  • Volume
    1
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    713
  • Abstract
    A digital calibration technique, which corrects errors due to capacitor mismatch and charge injection in pipelined ADC and directly measures the error coefficient using the ADC INL plot, is described. The proposed technique can be applied for various types of pipelined ADC architectures. Test results using an implemented 10-bit pipelined ADC show that the ADC achieves a peak signal-to-noise-and-distortion ratio of 56.6 dB, a peak integral nonlinearity of 0.3 LSB, and a peak differential nonlinearity of 0.3 LSB using the digital calibration.
  • Keywords
    analogue-digital conversion; calibration; charge injection; error correction; pipeline processing; CMOS technology; S/H stage; capacitor mismatch; charge injection; digital calibration technique; error analysis model; error measurement; factory calibration; flow chart; gain errors; interstage amplifiers; lump signal generation; offset errors; parallel pipelined ADC; peak differential nonlinearity; peak integral nonlinearity; Analog-digital conversion; CMOS technology; Calibration; Capacitors; Charge measurement; Circuits; Current measurement; Energy consumption; Error correction; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-7218-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2002.1006929
  • Filename
    1006929