Title :
Testing pass-band response and group delay of filters in system on a chip
Author_Institution :
LTX Corp., Westwood, MA, USA
fDate :
6/24/1905 12:00:00 AM
Abstract :
Filters at the front-end of ADCs must often be tested when only the ADC outputs are accessible. The measurement of the filter performance is contaminated by quantization and ADC noise. In the paper, the number of points that must be measured to appropriately identify the frequency response and time delay are evaluated. A method for generating multi-tone signals that can be used for determining frequency response is presented, and an optimum signal for evaluating time delay is identified. It is demonstrated that multi-tone testing and single tone testing require an equal number of samples, but additional filter settling time is required when single frequencies are changed. Software which generates optimum test signals is included. The efficiency of multi-tone testing is evaluated as a function of the number of tones.
Keywords :
AWGN; band-pass filters; frequency response; low-pass filters; mixed analogue-digital integrated circuits; quantisation (signal); signal sampling; ADC frontend; ADC noise; Gaussian amplitude distribution; SoC filter test; additional filter settling time; allowable uncertainty; filter performance; frequency response; group delay; low-pass filter; multitone signals; optimum signal; oversampling; pass-band response; quantization noise; signal generator; single tone testing; time delay; Delay effects; Filters; Frequency response; Noise measurement; Pollution measurement; Quantization; Semiconductor device measurement; Signal generators; Signal processing; System testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE
Print_ISBN :
0-7803-7218-2
DOI :
10.1109/IMTC.2002.1006930
