Title :
HIST: A METHODOLOGY FOR THE AUTOMATIC INSERTION OF A HIERARCHICAL SELF TEST
Author :
Haberl, Oliver F. ; Kropf, Thomas
Keywords :
Automatic control; Automatic testing; Circuit faults; Circuit testing; Distributed control; Fault tolerance; Hardware; Logic design; Logic testing; Read only memory;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527895
