• DocumentCode
    1665956
  • Title

    The pull-in of symmetrically and asymmetrically driven microstructures and the use in DC voltage references

  • Author

    Rocha, L.A. ; Cretu, E. ; Wolffenbuttel, R.F.

  • Author_Institution
    Delft Univ. of Technol., Netherlands
  • Volume
    1
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    759
  • Abstract
    Micromechanical structures have been designed, fabricated in silicon and tested for use as on-chip voltage reference Applications are in electrical metrology and in integrated silicon Microsystems. Microbeams of 100 μm length, 3 μm width and 11 μm thickness are electrostatically actuated with a very reproducible pull-in voltage. The structure can be either symmetrically or asymmetrically actuated, resulting in different pull-in voltages, as well as different operational specifications e.g. hysteresis and reproducibility. A two dimensional energy-based analytical model for the static pull-in is derived for both actuation types and compared with measurements. Devices have been designed and fabricated in an epi-poly process. Measurements show a pull-in voltage in the 9.1-9.5 V range for the asymmetric case and 10.5-11 V range for the symmetric case, both in agreement with modeling.
  • Keywords
    electrostatic actuators; hysteresis; measurement standards; mechanical stability; micromachining; voltage measurement; 10.5 to 11 V; 9.1 to 9.5 V; DC voltage reference; Taylor series; asymmetrically driven microstructures; electrostatically actuated microbeams; epi-poly process; equilibrium point coordinates; freestanding lateral beam; hysteresis; integrated silicon microsystems; local continuation method; long-term device stability; on-chip voltage reference; pull-in microstructure; reproducible pull-in voltage; static pull-in; surface micromachining; symmetrically driven microstructures; two dimensional energy-based analytical model; Analytical models; Energy measurement; Hysteresis; Metrology; Micromechanical devices; Microstructure; Reproducibility of results; Silicon; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-7218-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2002.1006937
  • Filename
    1006937