DocumentCode :
1666180
Title :
A 2.4GHz sub-harmonically injection-locked PLL with self-calibrated injection timing
Author :
Huang, Yi-Chieh ; Liu, Shen-Iuan
Author_Institution :
Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2012
Firstpage :
338
Lastpage :
340
Abstract :
A low-phase-noise integer-N phase-locked loop (PLL) is attractive in many applications, such as clock generation and analog-to-digital conversion. The sub-harmonically injection-locked technique, sub-sampling technique, and the multiplying delay-locked loop (MDLL) can significantly improve the phase noise of an integer-N PLL. In the sub-harmonically injection-locked technique, to inject a low-frequency reference clock into a high-frequency voltage-controlled oscillator (VCO), the injection timing should be tightly controlled. If the injection timing varies due to process variation, it may cause a large reference spur or even cause the PLL to fails to lock. A sub-harmonically injection-locked PLL (SILPLL) adopts a sub-sampling phase-detector (PD) to automatically align the phase between the injection pulse and a VCO. However, a sub-sampling PD has a small capture range and a low bandwidth. The high-frequency non-linear effects of a sub-sampling PD may degrade the accuracy and limit the maximum speed of a VCO. In addition, a frequency-locked loop is needed for a sub-sampling PD. A delay line is manually adjusted to achieve the correct injection timing. However, the delay line is sensitive to process variations. Thus, the injection timing should be calibrated.
Keywords :
clocks; frequency locked loops; phase detectors; phase locked loops; voltage-controlled oscillators; analog-to-digital conversion; clock generation; delay line; frequency 2.4 GHz; frequency-locked loop; injection timing calibration; low-phase-noise integer-N phase-locked loop; multiplying delay-locked loop; phase noise; reference clock; self-calibrated injection timing; sub-sampling technique; subharmonically injection-locked PLL; subharmonically injection-locked technique; subsampling phase-detector; voltage-controlled oscillator; Jitter; Noise measurement; Phase locked loops; Phase measurement; Phase noise; Pulse generation; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2012 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0193-6530
Print_ISBN :
978-1-4673-0376-7
Type :
conf
DOI :
10.1109/ISSCC.2012.6177037
Filename :
6177037
Link To Document :
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