Title :
On software reliability and code coverage
Author :
Karcich, Richard M. ; Skibbe, Robert ; Mathur, Aditya P. ; Garg, Praerit
Author_Institution :
Storage Technol. Corp., Louisville, CO, USA
Abstract :
Failure and module coverage data were collected during the system testing phase of a commercial hardware-software system called Product S. The Goel-Okumoto and Musa-Okumoto models were used to predict the Mean Test Cases to Failure (MTCTF) for these data. It was observed that the errors in predictions of MTCTF correlate with a sharp rise in code coverage. The sharp rise occurs when testers test code which was not previously tested. This observation suggests that software reliability prediction models may be able to improve the accuracy of prediction by accounting for code coverage
Keywords :
error analysis; failure analysis; program testing; software performance evaluation; software reliability; statistical analysis; Goel-Okumoto models; Mean Test Cases to Failure; Musa-Okumoto models; Product S; accuracy of prediction; code coverage; module coverage; software reliability; software reliability prediction models; system testing phase; Accuracy; Computer science; Phase measurement; Predictive models; Software engineering; Software measurement; Software reliability; Software testing; System testing; Time measurement;
Conference_Titel :
Aerospace Applications Conference, 1996. Proceedings., 1996 IEEE
Conference_Location :
Aspen, CO
Print_ISBN :
0-7803-3196-6
DOI :
10.1109/AERO.1996.499668
