Title :
Scalable replay with partial-order dependencies for message-logging fault tolerance
Author :
Lifflander, Jonathan ; Meneses, Esteban ; Menon, Harshitha ; Miller, Paul ; Krishnamoorthy, Sriram ; Kale, Laxmikant V.
Author_Institution :
Dept. of Comput. Sci., Univ. of Illinois Urbana-Champaign, Urbana, IL, USA
Abstract :
Deterministic replay of a parallel application is commonly used for discovering bugs or to recover from a hard fault with message-logging fault tolerance. For message passing programs, a major source of overhead during forward execution is recording the order in which messages are sent and received. During replay, this ordering must be used to deterministically reproduce the execution. Previous work in replay algorithms often makes minimal assumptions about the programming model and application to maintain generality. However, in many applications, only a partial order must be recorded due to determinism intrinsic in the program, ordering constraints imposed by the execution model, and events that are commutative (their relative execution order during replay does not need to be reproduced exactly). In this paper, we present a novel algebraic framework for reasoning about the minimum dependencies required to represent the partial order for different orderings and interleavings. By exploiting this framework, we improve on an existing scalable message-logging fault tolerance scheme that uses a total order. The improved scheme scales to 131,072 cores on an IBM BlueGene/P with up to 2× lower overhead.
Keywords :
fault tolerant computing; message passing; parallel processing; program debugging; IBM BlueGene/P; bugs discovery; message passing programs; message-logging fault tolerance; parallel application; partial-order dependencies; scalable replay; Benchmark testing; Debugging; Electronic mail; Fault tolerance; Fault tolerant systems; Program processors; Programming; determinism; execution model; fault tolerance; message logging; partial-order dependencies; replay;
Conference_Titel :
Cluster Computing (CLUSTER), 2014 IEEE International Conference on
Conference_Location :
Madrid
DOI :
10.1109/CLUSTER.2014.6968739