Title :
High current operation of the crossed-field secondary emission electron source
Author :
Saveliev, Y.M. ; Sibbett, W. ; Parkes, D.M.
Author_Institution :
Sch. of Phys. & Astron., St. Andrews Univ., UK
Abstract :
The crossed-field secondary emission (CFSE) diode is an electron source of a magnetron type that is capable of producing high current tubular electron beams in the range of 10/sup 2/-10/sup 3/ A. The electron beam is generated by means of a self-sustained secondary emission thus making the CFSE diode an essentially cold electron source. This results in a very high temporal stability of the electron beam which has a wall thickness of /spl sim/1 mm. The above features, together with an extremely simple and compact design, make the CFSE electron source attractive in various applications including electron accelerator systems and high power microwave production. This work has been aimed at determining the conditions under which the CFSE electron source produces high electron currents while retaining simultaneously reliable self-excitation. Several methods for achieving that goal have been identified and these have been validated experimentally and analysed in some detail. As a result of this research, stable electron beams with perveance of /spl sim/85 /spl mu/A/V/sup 3/2/ and current /spl sim/240 A were generated.
Keywords :
electron accelerators; electron beams; magnetrons; secondary electron emission; 1 mm; 1E2 to 1E3 A; 240 A; cold electron source; crossed-field secondary emission diode; crossed-field secondary emission electron source; electron accelerator systems; electron beams; electron currents; high current operation; high-power microwave production; magnetron electron source; reliable self-excitation; self-sustained secondary emission; temporal stability; Cathodes; Diodes; Electrodes; Electron beams; Electron sources; Kinetic energy; Magnetic fields; Physics; Steel; Voltage;
Conference_Titel :
Pulsed Power Conference, 1999. Digest of Technical Papers. 12th IEEE International
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-5498-2
DOI :
10.1109/PPC.1999.825500