Title :
Miniaturized large-grating-clearance linear encoder based on beam-splitting optical system with MOEMS LD and wireless moving part for rebound nondestructive testing
Author :
Yao, Rao ; Li, Xiaoxing ; Jiang, Lipei ; Yao, Peng ; Li, Xiaohong
Abstract :
One factor that limits use of grating linear encoders in rebound hammers for concrete nondestructive testing (NDT) is the lack of a sufficiently compact, dustproof and antiseismic structure. We investigate a miniaturized, large clearance and antiseismic beam-splitting-optical-system (BSOS) linear encoder using a wireless scanning unit and a scale unit. The scanning unit contains a scanning reticle and a total-reflection mirror. The scale unit contains a micro-opto-electro-mechanical systems (MOEMS) laser diode (LD), a photocell and a high strength steel tape scale. The BSOS reduces the linear encoder thickness to 1 cm, almost half that of the traditional one; the MOEMS LD enlarges the grating pair clearance by 1.4~2.4 times, improving durability and scratch resistance; and the wireless moving part enhances antiseismic performance. The linear encoder is integrated into a photoelectric digital rebound hammer to record, transform and digitize rebound displacement for NDT.
Keywords :
diffraction gratings; micro-optomechanical devices; nondestructive testing; optical beam splitters; semiconductor lasers; MOEMS LD; antiseismic; beam-splitting optical system; beam-splitting-optical-system linear encoder; grating linear encoders; micro-opto-electro-mechanical systems laser diode; miniaturized large-grating-clearance linear encoder; photocell; photoelectric digital rebound hammer; rebound hammers; rebound nondestructive testing; scale unit; scanning reticle; size 1 cm; steel tape scale; total-reflection mirror; wireless moving part; wireless scanning unit; Concrete; Gratings; Light emitting diodes; Mirrors; Nondestructive testing; Optical beams; Optical films; Optical receivers; Steel; Wires;
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
DOI :
10.1109/INEC.2010.5424878