1666413

Design for Testability Using Architectural Descriptions

Chickermane, Vivek ; Lee, Jaushin ; Patel, Janak H.

1992

752

Algorithm design and analysis; Circuit faults; Circuit testing; Counting circuits; Data mining; Design for testability; Flip-flops; High performance computing; Sequential circuits; Test pattern generators;

English

ieee

Test Conference, 1992. Proceedings., International

1089-3539

0-7803-0760-7

conf

10.1109/TEST.1992.527897

527897