DocumentCode
1666520
Title
Surface flashover of dielectrics immersed in super-cooled liquid nitrogen
Author
Butcher, M. ; Neuber, A. ; Krompholz, H. ; Hatfield, L.L. ; Kristiansen, M.
Author_Institution
Dept. of Electr. Eng., Texas Tech. Univ., Lubbock, TX, USA
Volume
1
fYear
1999
Firstpage
450
Abstract
In a fast coaxial setup, dielectric test sample and electrodes are immersed in super-cooled liquid nitrogen with a temperature near 68 K, and the flashover development process is characterized using fast optical and electrical diagnostics with nanosecond time resolution. The measured breakdown voltage as a function of consecutive flashover shots reaches its peak around the second flashover and declines to a constant value. This voltage is initially about 50% of the volume breakdown voltage in liquid nitrogen and drops to about 20% after the sample has been conditioned. Two materials, Lexan and alumina, were tested in the system and showed quite similar breakdown voltages, but alumina exhibited much more severe surface damage. The time resolved electrical diagnostic revealed three phases in the temporal development of the current. Phase 1 is a rapid rise to the mA regime that is probably associated with field emission. Phase 2 contains several pre-breakdown spikes with current amplitudes of less than 5 mA and duration of typically 20 nanoseconds that form and collapse over a period of tens to a couple hundred nanoseconds. Finally, Phase 3, is characterized by a rapid ionization across the surface with a current rise that covers 4 orders of magnitude in a few nanoseconds.
Keywords
alumina; cryogenics; field emission; flashover; insulating materials; insulation testing; ionisation; surface discharges; voltage measurement; 68 K; Lexan; alumina; breakdown voltage measurement; consecutive flashover shots; current amplitudes; dielectric test sample; dielectrics; electrodes; fast coaxial setup; fast electrical diagnostics; fast optical diagnostics; field emission; insulators behaviour; liquid nitrogen; nanosecond time resolution; pre-breakdown spikes; rapid ionization; super-cooled liquid nitrogen; surface damage; surface flashover; time resolved electrical diagnostics; volume breakdown voltage; Breakdown voltage; Coaxial components; Dielectric liquids; Dielectric measurements; Electrodes; Flashover; Nitrogen; Temperature; Testing; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference, 1999. Digest of Technical Papers. 12th IEEE International
Conference_Location
Monterey, CA, USA
Print_ISBN
0-7803-5498-2
Type
conf
DOI
10.1109/PPC.1999.825507
Filename
825507
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