DocumentCode
1666870
Title
A 1920×1080 3.65μm-pixel 2D/3D image sensor with split and binning pixel structure in 0.11pm standard CMOS
Author
Kim, Seong-Jin ; Kang, Byongmin ; Kim, James D K ; Lee, Keechang ; Kim, Chang-Yeong ; Kim, Kinam
Author_Institution
Samsung Adv. Inst. of Technol., Yongin, South Korea
fYear
2012
Firstpage
396
Lastpage
398
Abstract
In this paper, we present a 2nd-generation 2D/3D imager based on the pinned- photodiode pixel structure. The time-division readout architecture for both image types (color and depth) is maintained. A complete redesign of the imager makes pixels smaller and more sensitive than before. To obtain reliable depth information using a pinned-photodiode, a depth pixel is split into eight small pieces for high-speed charge transfer, and demodulated electrons are merged into one large storage node, enabling phase delay measurement with 52.8% demodulation contrast at 20MHz frequency. Furthermore, each split pixel gener- ates its own color information, offering a 2D image with full-HD resolution (1920x1080).
Keywords
charge exchange; demodulation; image resolution; image sensors; 2D/3D imager; 3.65μm-pixel 2D/3D image sensor; color information; demodulated electrons; demodulation contrast; frequency 20 MHz; full-HD resolution; high-speed charge transfer; large storage node; phase delay measurement; pinned-photodiode pixel structure; size 0.11 pm; split and binning pixel structure; standard CMOS; time-division readout architecture; Arrays; Color; Image color analysis; Image sensors; Logic gates; Sensors; Three dimensional displays;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2012 IEEE International
Conference_Location
San Francisco, CA
ISSN
0193-6530
Print_ISBN
978-1-4673-0376-7
Type
conf
DOI
10.1109/ISSCC.2012.6177063
Filename
6177063
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