• DocumentCode
    1666870
  • Title

    A 1920×1080 3.65μm-pixel 2D/3D image sensor with split and binning pixel structure in 0.11pm standard CMOS

  • Author

    Kim, Seong-Jin ; Kang, Byongmin ; Kim, James D K ; Lee, Keechang ; Kim, Chang-Yeong ; Kim, Kinam

  • Author_Institution
    Samsung Adv. Inst. of Technol., Yongin, South Korea
  • fYear
    2012
  • Firstpage
    396
  • Lastpage
    398
  • Abstract
    In this paper, we present a 2nd-generation 2D/3D imager based on the pinned- photodiode pixel structure. The time-division readout architecture for both image types (color and depth) is maintained. A complete redesign of the imager makes pixels smaller and more sensitive than before. To obtain reliable depth information using a pinned-photodiode, a depth pixel is split into eight small pieces for high-speed charge transfer, and demodulated electrons are merged into one large storage node, enabling phase delay measurement with 52.8% demodulation contrast at 20MHz frequency. Furthermore, each split pixel gener- ates its own color information, offering a 2D image with full-HD resolution (1920x1080).
  • Keywords
    charge exchange; demodulation; image resolution; image sensors; 2D/3D imager; 3.65μm-pixel 2D/3D image sensor; color information; demodulated electrons; demodulation contrast; frequency 20 MHz; full-HD resolution; high-speed charge transfer; large storage node; phase delay measurement; pinned-photodiode pixel structure; size 0.11 pm; split and binning pixel structure; standard CMOS; time-division readout architecture; Arrays; Color; Image color analysis; Image sensors; Logic gates; Sensors; Three dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2012 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    978-1-4673-0376-7
  • Type

    conf

  • DOI
    10.1109/ISSCC.2012.6177063
  • Filename
    6177063