• DocumentCode
    1666875
  • Title

    Dielectrophoretic addressable deposition of arc-SWCNTs for high-throughput screening FET arrays

  • Author

    Guo, Wei ; Dou, Zengpei ; Tian, Xiaoxue ; Sun, Hongfang ; Huang, Yanyi ; Xu, Dongsheng ; Liu, Yuanfang

  • Author_Institution
    Dept. Chem. Biol., Peking Univ., Beijing, China
  • fYear
    2010
  • Firstpage
    490
  • Lastpage
    491
  • Abstract
    For fabrication of arc-discharged single walled carbon nanotubes (arc-SWCNTs) based FET array, controllable deposition of SWNTs is an important issue. In this study highly purified arc-SWCNTs are deposited on the high-throughput screening FET array via the addressable dielectrophoresis method. The electrodes array are designed with different electrode gaps, from 3 to 20 ¿m, every electrode has its own address. In order to limit the SWCNTs to be deposited within the electrodes area, we designed a deposition window on the silicon chip surface by the optical lithography. Then the diluted SWCNTs solution was dropped onto the limited window. By setting a voltage (10 V, 100 kHz) between a specific source electrode and the shared drain electrode, the SWCNTs can be aligned evenly within the pair of electrodes via the dielectrophoresis process. This method might facilitate the controllable fabrication of high throughput screening SWCNTs-FET arrays for biosensors.
  • Keywords
    arcs (electric); carbon nanotubes; electrochemical electrodes; electrophoresis; field effect transistors; nanofabrication; photolithography; C; SWCNT-FET arrays; arc-SWCNT; arc-discharged single walled carbon nanotubes; biosensors; deposition window; dielectrophoretic addressable deposition; diluted SWCNT solution; drain electrode; electrode array; frequency 100 kHz; high-throughput screening FET array; optical lithography; silicon chip surface; size 3 mum to 20 mum; specific source electrode; voltage 10 V; Biomedical optical imaging; Carbon nanotubes; Dielectrophoresis; Electrodes; FETs; Fabrication; Lithography; Optical design; Silicon; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2010 3rd International
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-3543-2
  • Electronic_ISBN
    978-1-4244-3544-9
  • Type

    conf

  • DOI
    10.1109/INEC.2010.5424895
  • Filename
    5424895