DocumentCode
1666960
Title
CTR degradation and ageing problem of optocouplers
Author
Bajenesco, T.
Author_Institution
13 Ch. de Riant-Coin, Switzerland
fYear
1995
Firstpage
173
Lastpage
175
Abstract
The paper reviews the optocoupler ageing problem, the main causes of the potential CTR degradation, the explanation of the increase in the proportion of recombination current, and certain important aspects of the reliability of optocouplers
Keywords
ageing; opto-isolators; optoelectronic devices; semiconductor device reliability; CTR degradation; ageing; current transfer ratio; optocouplers; recombination current; reliability; Aging; Current density; Degradation; Electron emission; Light emitting diodes; Photoconductivity; Power system modeling; Radiative recombination; Spontaneous emission; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology, 1995 4th International Conference on
Conference_Location
Beijing
Print_ISBN
0-7803-3062-5
Type
conf
DOI
10.1109/ICSICT.1995.499774
Filename
499774
Link To Document