Title :
Detection of undetectable faults using IDDQ testing
Author :
Gulati, Ravi K. ; Mao, Weiwei ; Goel, Deepak K.
Keywords :
Analytical models; Circuit faults; Circuit simulation; Circuit testing; Degradation; Electrical fault detection; Fault detection; Logic circuits; Logic devices; Voltage;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527899
