• DocumentCode
    1666962
  • Title

    Detection of undetectable faults using IDDQ testing

  • Author

    Gulati, Ravi K. ; Mao, Weiwei ; Goel, Deepak K.

  • fYear
    1992
  • Firstpage
    770
  • Keywords
    Analytical models; Circuit faults; Circuit simulation; Circuit testing; Degradation; Electrical fault detection; Fault detection; Logic circuits; Logic devices; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527899
  • Filename
    527899
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1666962