Title :
Magnetic modulator lifetime tests using the Sandia reliability test-bed
Author :
Reed, K.W. ; Schneider, L.X. ; Pena, G.E. ; Martinez, L.E.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
Experimental results are presented that provide design guidelines for high repetition rate, long-life pulsed power magnetic modulators. Fault mechanisms that occurred during a series of 32 million shots at 100 pps, with continuous runs of up to 5.7 million shots (/spl sim/16 hours) on the Dos Lineas magnetic modulator are described. An effort to explain the fault mechanisms and how to avoid them is made. Factors that limit the long life performance of a variety of components including switches, cables and oil are encountered. The high reliability of the magnetic switch technology is demonstrated.
Keywords :
failure analysis; life testing; magnetic switching; pulsed power supplies; pulsed power switches; reliability; Dos Lineas magnetic modulator; Sandia reliability test-bed; cables; fault mechanisms; high reliability; high repetition rate; long life performance; long-life pulsed power magnetic modulators; magnetic modulator lifetime tests; magnetic switch technology; oil; switches; Life testing; Lifetime estimation; Magnetic cores; Magnetic modulators; Magnetic separation; Magnetic switching; Petroleum; Pulse modulation; Switches; Toroidal magnetic fields;
Conference_Titel :
Pulsed Power Conference, 1999. Digest of Technical Papers. 12th IEEE International
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-5498-2
DOI :
10.1109/PPC.1999.825526