• DocumentCode
    1667178
  • Title

    Finite element modelling of electron transport in structures involving secondary electron emission and wall charging

  • Author

    Riggs, R.J.

  • Author_Institution
    MIMIV Ltd., Hartlepool, UK
  • fYear
    2005
  • Firstpage
    105
  • Lastpage
    106
  • Abstract
    The following have been reported on modelling of real hop plates in this paper: 1) It took about a month of programming to develop an initial version of the custom part of the software. 2) A model is solved in hours, rather than weeks for the Monte Carlo method. 3) The models settle into a stable state, in which the surface charge tends to produce an electric field along the walls which is fairly constant, and lower than the field with no charge. This works for a range of secondary emission parameters. 4) The calculated trajectories and field distributions are in good agreement with the published Monte Carlo simulations.
  • Keywords
    finite element analysis; plates (structures); secondary electron emission; surface charging; electric field; electron transport; finite element modelling; real hop plates; secondary electron emission; surface charge; wall charging; Acceleration; Electron emission; Electron sources; Electrostatics; Field emitter arrays; Finite element methods; Glass; Insulation life; Packaging; Surface charging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International
  • Print_ISBN
    0-7803-8397-4
  • Type

    conf

  • DOI
    10.1109/IVNC.2005.1619507
  • Filename
    1619507