Title :
Field screening by amorphous carbon thin films
Author :
Xanthakis, J.P. ; Forbes, Richard G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Athens Nat. Tech. Univ., Greece
Abstract :
We argue that the granularity of the screening charge distribution at or in the film surface may dominate the physics of field penetration into hopping conductors (including a-c:H films) and that a re-think of all related modelling looks necessary.
Keywords :
amorphous state; carbon; field emission; granular structure; hopping conduction; thin films; C; amorphous carbon thin films; field penetration; field screening; film surface; granularity; hopping conductors; screening charge distribution; Amorphous materials; Carbon dioxide; Conducting materials; Electron emission; Materials science and technology; Physics computing; Semiconductor films; Semiconductor materials; Semiconductor thin films; Transistors;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International
Print_ISBN :
0-7803-8397-4
DOI :
10.1109/IVNC.2005.1619508
