• DocumentCode
    1667348
  • Title

    The influences of particle sizes on the dielectric properties of PEI/(Ba0.8Sr0.2)(Ti0.9Zr0.1)O3 composites

  • Author

    Wu, Chia-Ching ; Diao, Chien-Chen ; Yang, Cheng-Fu ; Hong, Cheng-Shong

  • Author_Institution
    Dept. of Electron. Eng., Kao Yuan Univ., Kaohsiung, Taiwan
  • fYear
    2010
  • Firstpage
    1272
  • Lastpage
    1273
  • Abstract
    Polyetherimide/(Ba0.8Sr0.2)(Ti0.9Zr0.1)O3 (PEI/BSTZ) composites are fabricated using solvents, dispersant (KD1), PEI, (Ba0.8Sr0.2)(Ti0.9Zr0.1)O3 ceramic powders. The dielectric constants of PEI/BSTZ composites with different contents and three different sizes (3 ¿m, 200 nm, and 100 nm) of BSTZ ceramic powders are measured using the plate method. The Lichtenecker logarithmic mixing rules are used to fit the measured results and predict the dielectric constants. As the content of BSTZ powders increases from 10 wt% to 70 wt%, the dielectric constants of PEI/BSTZ composites increase with the increase of BSTZ contents. When the content of BSTZ is more than 50 wt% and 100 nm and 200 nm BSTZ powders are used, the measured dielectric constants of PEI/BSTZ composites are lower than the theoretical values.
  • Keywords
    barium compounds; ferroelectric ceramics; particle reinforced composites; particle size; permittivity; polymers; powders; strontium compounds; titanium compounds; zirconium compounds; (Ba0.8Sr0.2)(Ti0.9Zr0.1)O3; BSTZ ceramic powders; Lichtenecker logarithmic mixing rules; PEI/BSTZ composites; dielectric constants; dielectric properties; dispersant; particle sizes; plate method; polyetherimide; size 100 nm; size 200 nm; size 3 mum; solvents; Ceramics; Dielectric constant; Dielectric materials; Dielectric measurements; Ferroelectric materials; Polymers; Powders; Scanning electron microscopy; Size measurement; Solvents;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2010 3rd International
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-3543-2
  • Electronic_ISBN
    978-1-4244-3544-9
  • Type

    conf

  • DOI
    10.1109/INEC.2010.5424911
  • Filename
    5424911