Title :
ESD troubleshooting using multi-level TLP
Author_Institution :
Infineon Technol., Neubiberg, Germany
Abstract :
Standard TLP with 100ns pulse width often fail to reproduce anomalous ESD failures in products. However multi-level TLP based on the advanced hardware modifications and settings is capable of reproducing many such failures, hence significantly improving ESD troubleshooting. Representative case studies confirm the usefulness of this technique.
Keywords :
electrostatic discharge; failure analysis; ESD troubleshooting; advanced hardware modifications; anomalous ESD failures; multilevel TLP; time 100 ns; Electrostatic discharges; IEC; IEC standards; Pins; Resistors; Robustness; Stress;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th
Conference_Location :
Tucson, AZ
