Title :
Rail clamp with dynamic time constant adjustment
Author :
Venkatasubramanian, Ramakrishnan ; Ozev, Sule ; Oertle, Kent
Author_Institution :
Broadcom Corp., Chandler, AZ, USA
Abstract :
A dual time constant rail clamp is introduced. A relatively small time constant is dynamically adjusted, after the clamp is triggered during the electrostatic discharge (ESD) event, to hold the clamp ON and dissipate the full ESD event. ESD and performance results for the new clamp are presented.
Keywords :
clamps; electrostatic discharge; semiconductor device models; transistors; ESD; dynamic time constant adjustment; electrostatic discharge; rail clamp; Clamps; Electrostatic discharges; Logic gates; Mirrors; Rails; Resistors; Transistors;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th
Conference_Location :
Tucson, AZ
