DocumentCode
166770
Title
Reflection control in VF-TLP systems
Author
Grund, E. ; Chang, T. ; Gauthier, R. ; Grund, K. ; Hernandez, J. ; Katz, J. ; Poro, R.
Author_Institution
Grund Tech. Solutions, Milpitas, CA, USA
fYear
2014
fDate
7-12 Sept. 2014
Firstpage
1
Lastpage
10
Abstract
TLP characterizations are derived from analyzing pulses going to and reflections coming back from the DUT. Unfortunately, secondary reflections echo between the TLP pulse generator and DUT producing extraneous stresses. Reflection control techniques are reviewed and new methods using reflection cancellation for VF-TLP, which prevent inverted voltage re-reflections, is described.
Keywords
pulse generators; reflection; semiconductor device metallisation; semiconductor device testing; semiconductor diodes; transmission lines; DUT; TLP characterizations; TLP pulse generator; VF-TLP systems; device under test; inverted voltage rereflections; reflection cancellation; reflection control techniques; secondary reflections echo; very fast transmission line pulses; Attenuators; Reflection;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th
Conference_Location
Tucson, AZ
ISSN
0739-5159
Type
conf
Filename
6968820
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