Title :
Reflection control in VF-TLP systems
Author :
Grund, E. ; Chang, T. ; Gauthier, R. ; Grund, K. ; Hernandez, J. ; Katz, J. ; Poro, R.
Author_Institution :
Grund Tech. Solutions, Milpitas, CA, USA
Abstract :
TLP characterizations are derived from analyzing pulses going to and reflections coming back from the DUT. Unfortunately, secondary reflections echo between the TLP pulse generator and DUT producing extraneous stresses. Reflection control techniques are reviewed and new methods using reflection cancellation for VF-TLP, which prevent inverted voltage re-reflections, is described.
Keywords :
pulse generators; reflection; semiconductor device metallisation; semiconductor device testing; semiconductor diodes; transmission lines; DUT; TLP characterizations; TLP pulse generator; VF-TLP systems; device under test; inverted voltage rereflections; reflection cancellation; reflection control techniques; secondary reflections echo; very fast transmission line pulses; Attenuators; Reflection;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th
Conference_Location :
Tucson, AZ