Title :
A parallel technique for ATPG using genetic algorithms
Author :
Sabry, Mohamed ; Wahba, Ayman ; Mahdi, Hani
Author_Institution :
Dept. of Comput. & Syst. Eng., Ain Shams Univ., Cairo, Egypt
fDate :
6/20/1905 12:00:00 AM
Abstract :
This paper presents a new technique for test pattern generation based on a genetic algorithm and parallel processing techniques. This new method offers compact test sets, compared to other methods, that achieve maximum coverage
Keywords :
automatic test pattern generation; genetic algorithms; integrated circuit testing; logic testing; parallel algorithms; ATPG; compact test sets; genetic algorithms; maximum coverage; parallel processing techniques; test pattern generation; Automatic test pattern generation; Biological cells; Circuit faults; Circuit testing; Genetic algorithms; Genetic engineering; Genetic mutations; Logic; Terminology; Test pattern generators;
Conference_Titel :
Microelectronics, 1998. ICM '98. Proceedings of the Tenth International Conference on
Conference_Location :
Monastir
Print_ISBN :
0-7803-4969-5
DOI :
10.1109/ICM.1998.825571
