Title :
2001 IEEE International SOI Conference. Proceedings (Cat. No.01CH37207)
Abstract :
The following topics were discussed: SOI materials technology; devices and device modelling; reliability; circuit applications
Keywords :
semiconductor device models; semiconductor device reliability; silicon-on-insulator; SOI; circuit applications; device modelling; materials technology; reliability;
Conference_Titel :
SOI Conference, 2001 IEEE International
Conference_Location :
Durango, CO, USA
Print_ISBN :
0-7803-6739-1
DOI :
10.1109/SOIC.2001.957956
