Title :
A non-typical latch-up event on HV ESD protection
Author :
Shih-Yu Wang ; Hao-Chan Huang ; Chieh-Wei He ; Yao-Wen Chang ; Tao-Cheng Lu ; Kuang-Chao Chen ; Chih-Yuan Lu
Author_Institution :
Macronix Int. Co., Ltd., Hsinchu, Taiwan
Abstract :
An unexpected non-typical latch-up phenomenon from HV pad instead of power supply is discovered. Although there are double guard rings and the spacing between anode and cathode of SCR is long, the holding voltage is still extremely low. The key factors of the failed case are well studied by TCAD and solution is proposed.
Keywords :
anodes; cathodes; electrostatic discharge; technology CAD (electronics); thyristors; HV ESD protection; SCR; TCAD; anode; cathode; latch-up event; power supply; Capacitors; Cathodes; Electrostatic discharges; Integrated circuits; Lead; MOS devices; Thyristors;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th
Conference_Location :
Tucson, AZ
