DocumentCode
1668078
Title
Magnetic properties and microstructure of Fe/FePt films with perpendicular magnetization
Author
Tsai, Jai-Lin ; Tzeng, Hsin-Te ; Liu, Bing-Fong
Author_Institution
Dept. of Mater. Sci. & Eng., Nat. Chung Hsing Univ., Taichung, Taiwan
fYear
2010
Firstpage
1208
Lastpage
1209
Abstract
The soft/hard Fe/FePt bilayer with perpendicular magnetization has been prepared successfully on glass substrate. The (001) oriented L10 FePt film with fix thickness 10 nm was deposited on glass and subsequently annealing by rapid thermal process (RTP) at 800°C for 5 minutes and a Fe layer was deposited at room temperature with thickness of 2 nm to 10 nm. The control of Fe layer thickness allowed modifying the hysteresis loops from rigid magnet to exchange-spring magnet due to the nanoscale soft/hard interface coupling. When the Fe layer thickness increased to 3 nm, the out-of-plane coercivity is reduced to 5.88 kOe but the remanence ratio (0.98) is high. The Fe (3 nm)/FePt bilayer shows perpendicular magnetization with linear in-plane hysteresis loop. The remanence ratio is reduced to 0.86 when the Fe layer thickness increased up to 6 nm. When the Fe layer increased up to 10 nm, the hysteresis loop shows exchange spring-like behavior. The out-of-plane coercivity is still 4 kOe but the remanence ratio is 0.19. The films with perpendicular coercivity were moderated successfully by the soft magnetic layer with different thickness.
Keywords
coercive force; crystal microstructure; iron; iron alloys; magnetic hysteresis; magnetic thin films; nanostructured materials; platinum alloys; rapid thermal annealing; remanence; (001) oriented L10 FePt film; Fe-FePt; annealing; exchange spring-like property; exchange-spring magnet; glass substrate; iron layer; linear in-plane hysteresis loop; microstructure; nanoscale soft-hard interface coupling; out-of-plane coercivity; perpendicular coercivity; perpendicular magnetization; rapid thermal process; remanence; size 2 nm to 10 nm; soft-hard bilayer; temperature 293 K to 1073 K; thin films; time 5 min; Coercive force; Glass; Iron; Magnetic films; Magnetic hysteresis; Magnetic properties; Magnetization; Microstructure; Remanence; Soft magnetic materials;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-3543-2
Electronic_ISBN
978-1-4244-3544-9
Type
conf
DOI
10.1109/INEC.2010.5424945
Filename
5424945
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