DocumentCode
166817
Title
Multi-reflection TLP: A new measurement technique for system-level automotive ESD/EMC characterization
Author
Farbiz, F. ; Salman, A.A.
Author_Institution
Analog ESD Team, Texas Instrum., Dallas, TX, USA
fYear
2014
fDate
7-12 Sept. 2014
Firstpage
1
Lastpage
6
Abstract
A new experimental setup is presented to characterize ESD protections under various stress conditions of automotive ESD/EMC qualifications. Through a software interface, this system can generate waveforms suited for specific applications. Several examples are given for characterization of device response to in-vehicle ESD/EMC events.
Keywords
automotive electronics; electromagnetic compatibility; electrostatic discharge; ESD protections; automotive EMC qualifications; automotive ESD qualifications; in-vehicle EMC events; in-vehicle ESD events; measurement technique; multireflection TLP; software interface; stress conditions; system-level automotive; Cable shielding; Discharges (electric); Electrostatic discharges; Impedance; Power cables; Standards; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th
Conference_Location
Tucson, AZ
ISSN
0739-5159
Type
conf
Filename
6968846
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