DocumentCode :
1668209
Title :
Operation of high speed switching systems based on bipolar transistors in nuclear radiation environments
Author :
Soliman, Fouad A S ; Montasser, K. ; Kamh, S.A. ; Abdel-Maksood, A.M.
Author_Institution :
Nucl. Mater. Authority, Cairo, Egypt
fYear :
1998
fDate :
6/20/1905 12:00:00 AM
Firstpage :
145
Lastpage :
148
Abstract :
Operation of high speed switching system based on bipolar transistors in nuclear radiation environment was investigated either theoretically or experimentally. The switching equations of the active device and circuit were solved, where transient switching time parameters were computed. The study was extended to include the effects of different nuclear radiation types (neutrons, protons, electrons and gamma) on the devices, as well as their corresponding effects on the switching system behaviour
Keywords :
bipolar transistor switches; electron beam effects; gamma-ray effects; neutron effects; power semiconductor switches; proton effects; radiation hardening (electronics); active device; bipolar transistor based; electron effects; forward current gain factor; gamma ray effects; high speed switching systems; neutron effects; nuclear radiation environment operation; proton effects; switching equations; transient switching time parameters; Bipolar transistors; Electrons; Equations; Failure analysis; Neutrons; Performance analysis; Protons; Switches; Switching circuits; Switching systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics, 1998. ICM '98. Proceedings of the Tenth International Conference on
Conference_Location :
Monastir
Print_ISBN :
0-7803-4969-5
Type :
conf
DOI :
10.1109/ICM.1998.825589
Filename :
825589
Link To Document :
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