Title :
Infrared and terahertz nanoscopy
Author :
Hillenbrand, Rainer
Author_Institution :
Nanooptics Group, CIC nanoGUNE Consolider, Donostia-San Sebastian, Spain
Abstract :
We demonstrate nanoscale resolved IR and THz imaging by recording the elastically scattered light from the laser-illuminated tip of an atomic force microscope tip. Applications such as electronic and photonic device characterization will be presented.
Keywords :
atomic force microscopy; infrared imaging; light scattering; optical microscopy; terahertz wave imaging; atomic force microscope tip; elastically scattered light; infrared imaging; infrared nanoscopy; laser-illuminated tip; terahertz imaging; terahertz nanoscopy; Atomic force microscopy; Electron microscopy; Nanoscale devices; Optical imaging; Optical interferometry; Optical microscopy; Near-field microscopy; infrared; plasmon mapping; terahertz;
Conference_Titel :
Photonics Society Summer Topical Meeting Series, 2010 IEEE
Conference_Location :
Playa del Carmen
Print_ISBN :
978-1-4244-3730-6
Electronic_ISBN :
978-1-4244-3731-3
DOI :
10.1109/PHOSST.2010.5553706
