Title :
Structural characterization and field emission of stacked-cone GaN nanorods
Author :
Li, Chun ; Huang, Yang ; Bando, Yoshio ; Golberg, Dmitri
Author_Institution :
World Premier Int. Center for Mater. Nanoarchitectonics (MANA), Nat. Inst. for Mater. Sci., Japan
Abstract :
The stacked-cone morphology GaN nanorods with diameters of 100-400 nm and lengths of tens of micrometers were synthesized by metal-catalyzed chemical vapor deposition. The stacked-cone GaN nanorods possessed dominated hexagonal crystalline structure with growth direction along [0001]. TEM analysis showed that the top tip had a bicrystal structure of hexagonal and cubic phases, while the stem and side tip had single hexagonal phase. Room temperature field emission test showed the turn-on field was 8.9 V/¿m at 0.1 ¿A/cm2 and current density was about 0.1 mA/cm2 at 14.2 V/¿m at a vacuum gap of 70 ¿m. The field enhancement factor à and anode-cathode gap d follows a universal equation. The simple synthesis method and good emission properties imply their potential application in vacuum microelectronic.
Keywords :
III-V semiconductors; anodes; cathodes; chemical vapour deposition; crystal structure; current density; field emission; gallium compounds; nanostructured materials; transmission electron microscopy; vacuum microelectronics; GaN; TEM analysis; [0001] growth direction; anode-cathode gap; bicrystal structure; cubic phase; current density; field emission; field enhancement factor Ã\x9f; hexagonal crystalline structure; hexagonal phase; metal-catalyzed chemical vapor deposition; size 100 nm to 400 nm; stacked-cone morphology nanorods; temperature 293 K to 298 K; vacuum gap; vacuum microelectronic; Carbon nanotubes; Current density; Electron emission; Gallium nitride; Iron; Microelectronics; Nanowires; Scanning electron microscopy; Semiconductor nanostructures; Testing;
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
DOI :
10.1109/INEC.2010.5424952