Title :
Inadmissible Class of Boolean Functions under Stuck-at Faults
Author :
Das, Debesh K. ; Chowdhury, Debabani ; Bhattacharya, Bhargab B. ; Sasao, T.
Author_Institution :
Comput. Sc. & Eng. Dept., Jadavpur Univ., Kolkata, India
Abstract :
Several underlying structural and functional factors that determine the fault behavior of a network are not yet well understood. In this paper, we show that there exists a large class of Boolean functions, called root functions, which can never appear as faulty response in an irredundant two-level circuit even when any arbitrary multiple stuck-at faults are injected. Conversely, we show that any other Boolean function can appear as a faulty response in an irredundant realization of some root function under certain stuck-at faults. We characterize this new class of functions and show that for n variables, their number is exactly equal to the number of independent dominating sets (Harary and Livingston, Appl. Math. Lett., 1993) in a Boolean n-cube. Similar properties are observed for multiple-valued logic functions as well. Finally, we discuss its application to logic design and point out some open problems.
Keywords :
Boolean functions; fault diagnosis; logic design; logic testing; multivalued logic circuits; AND-OR circuits; Boolean functions; Boolean n-cube; arbitrary stuck-at faults; dominating set; fault behavior; faulty response; functional factor; logic design; multiple-valued logic functions; root functions; structural factor; two-level circuit; Circuit faults; Combinational circuits; Hamming distance; Hypercubes; Logic functions; Logic gates; Boolean functions; Multiple-valued functions; hypercube; redundancy; stuck-at faults; testing;
Conference_Titel :
Multiple-Valued Logic (ISMVL), 2014 IEEE 44th International Symposium on
Conference_Location :
Bremen
DOI :
10.1109/ISMVL.2014.49