• DocumentCode
    1668265
  • Title

    One-pass redundancy identification and removal

  • Author

    Abramovici, Miron ; Iyer, Mahesh A.

  • fYear
    1995
  • Firstpage
    807
  • Keywords
    Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Fault diagnosis; Logic circuits; Redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527904
  • Filename
    527904
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1668265