Title :
A co-optimization methodology on ESD robustness and functionality for pad-ring circuitry
Author :
Kuo-Hsuan Meng ; Gerdemann, Alex ; Miller, James W. ; Rosenbaum, Elyse
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
The proposed co-design methodology simultaneously optimizes the ESD robustness and functionality of I/O circuitry. The methodology formulates an equivalent optimization problem so that the ESD and I/O driver networks can be optimized without a priori knowledge of peripheral pre-driver circuitry.
Keywords :
electrostatic discharge; network synthesis; ESD; I/O circuitry; I/O driver networks; pad-ring circuitry; Electrostatic discharges; Integrated circuit modeling; Layout; Manganese; Resistors; Robustness; Stress;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th
Conference_Location :
Tucson, AZ
