Title :
Table of contents
Abstract :
The following topics are dealt with: ESD protection; factory control; system-on-chip ESD design; TCAD assisted ESD; EOS-ESD electronic design automation; ESD device optimization; ESD tester; CMOS; on-chip HV; and EOS-ESD characterization methods.
Keywords :
CMOS integrated circuits; electronic design automation; electrostatic discharge; integrated circuit modelling; system-on-chip; technology CAD (electronics); CMOS; EOS-ESD characterization methods; EOS-ESD electronic design automation; ESD device optimization; ESD protection; ESD tester; TCAD assisted ESD; factory control; on-chip HV; system-on-chip ESD design; Carbon;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th
Conference_Location :
Tucson, AZ
