• DocumentCode
    1668545
  • Title

    Recursive Learning: An attractive alternative to the decision tree for test generation in digital ci

  • Author

    Kunz, Wolfgang ; Pradhan, Dhiraj K.

  • fYear
    1992
  • Firstpage
    816
  • Keywords
    Circuit faults; Circuit testing; Combinational circuits; Decision trees; Logic testing; Sequential analysis; Sequential circuits; Signal generators; Space exploration; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527905
  • Filename
    527905