• DocumentCode
    1668809
  • Title

    Development of a low emittance electron gun based on field emission cathodes

  • Author

    Ganter, R. ; Bakker, R.J. ; Betemps, R. ; Dehler, M. ; Gerber, T. ; Gobrecht, J. ; Gough, C. ; Johnson, M. ; Kirk, E. ; Knopp, G. ; Le Pimpec, F. ; Li, K. ; Paraliev, M. ; Pedrozzi, M. ; Rivkin, L. ; Sehr, H. ; Schulz, L. ; Wrulich, A.

  • Author_Institution
    Paul Scherrer Inst., Villigen, Switzerland
  • fYear
    2005
  • Firstpage
    244
  • Lastpage
    245
  • Abstract
    Field emitters are investigated for use as a low emittance electron gun. Two available field emitter technologies are currently explored; the field emitter arrays (FEAs) with individual focusing and single tip cathode with robust and fairly blunt apex. The challenge is to achieve several amperes of peak current without tip destructions. Very good cathode and environmental conditioning procedures with extremely short emission duration (ns) at low repetition rate (10 Hz) gave encouraging results to reach high peak current emission. For a free electron laser application, very short emission durations are preferred. Such operation regime should prevent the tip from overheating so that higher current densities could be reached. Another possible low emittance electron sources are single needle tips made from etched wires and which can be coated and formed in order to carry high current emission. One way to achieve short emission duration is to use pulsed laser light illuminating the tip while high electric field is applied.
  • Keywords
    cathodes; current density; electron guns; field emitter arrays; free electron lasers; 10 Hz; apex; current densities; emission duration; etched wires; field emission cathodes; field emitter arrays; focusing; free electron laser application; low emittance electron gun; overheating; peak current emission; pulsed laser light; repetition rate; single needle tips; single tip cathode; tip destructions; Cathodes; Current density; Electron emission; Electron sources; Etching; Field emitter arrays; Free electron lasers; Laser applications; Needles; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International
  • Print_ISBN
    0-7803-8397-4
  • Type

    conf

  • DOI
    10.1109/IVNC.2005.1619577
  • Filename
    1619577