Title :
A Test Generation Methodology for High-Performance Computer Chips and Modules
Author :
Konemann, B. ; Noto, Phil
Keywords :
Automatic testing; Built-in self-test; Circuit testing; Clocks; Delay; Logic arrays; Logic testing; Packaging; Registers; Test equipment;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527906
