DocumentCode
1668838
Title
On the comparison of pseudo-random number generators for VLSI applications
Author
Alabbdi, M.M. ; Alrumiah, Rumaih M. ; Adi, Majed
Author_Institution
KACST/ECRI, Saudi Arabia
fYear
1998
fDate
6/20/1905 12:00:00 AM
Firstpage
262
Lastpage
264
Abstract
Hortensius et al. have proposed a metric to compare pseudo-random number generators (PRNG) for VLSI applications. The metric is some form of a weighted average of the number sequences generated by the same PRNG that failed specific number of tests. In this paper, this proposed metric is more closely analyzed, and its pitfalls are high-lighted. The metric is then generalized, and a criterion is devised to compare PRNG´s for VLSI applications
Keywords
VLSI; random number generation; Hortensius metric; VLSI; pseudo-random number generator; Autocorrelation; Automatic testing; Built-in self-test; Cryptography; Game theory; Lattices; Random number generation; Very large scale integration; Voting;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics, 1998. ICM '98. Proceedings of the Tenth International Conference on
Conference_Location
Monastir
Print_ISBN
0-7803-4969-5
Type
conf
DOI
10.1109/ICM.1998.825614
Filename
825614
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