• DocumentCode
    1668961
  • Title

    Fabrication of novel ZnS/ZnAl2S4 nanocomposite using a facile solvothermal route

  • Author

    Pilapong, Chalermchai ; Thongtem, Titipun ; Thongtem, Somchai

  • Author_Institution
    Dept. of Chem. Fac. of Sci., Chiang Mai Univ., Chiang Mai, Thailand
  • fYear
    2010
  • Firstpage
    517
  • Lastpage
    518
  • Abstract
    Novel ZnS/ZnAl2S4 nanocomposites were successfully synthesized via a surfactant-free solvothermal method using propylene glycol as a solvent. This method is mild, convenient, cheap and effective. X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), energy dispersive X-ray spectroscopy (EDS), transmission electron microscopy (TEM), and photoluminescene spectroscopy techniques were used to characterize the ZnS/ZnAl2S4 nanocomposites and the bare ZnS nanorods. The results show that the nanocomposites were built up from a zinc blend ZnS nanorod core and wurzite ZnAl2S4 shell. Due to the PL spectra, the presence of ZnAl2S4 shell on ZnS nanorod can dramatically change optical properties of the nanocomposites. In addition, the formation mechanism of the ZnS/ZnAl2S4 nanocomposites was also discussed.
  • Keywords
    II-VI semiconductors; X-ray chemical analysis; X-ray diffraction; aluminium compounds; chalcogenide glasses; field emission electron microscopy; nanocomposites; nanofabrication; photoluminescence; scanning electron microscopy; semiconductor growth; transmission electron microscopy; wide band gap semiconductors; zinc compounds; X-ray diffraction; ZnS-ZnAl2S4; energy dispersive X-ray spectroscopy; field emission scanning electron microscopy; nanocomposites; nanorods; optical properties; photoluminescene spectroscopy; surfactant-free solvothermal method; transmission electron microscopy; Anti-freeze; Electron emission; Fabrication; Nanocomposites; Scanning electron microscopy; Solvents; Spectroscopy; Transmission electron microscopy; X-ray diffraction; Zinc compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2010 3rd International
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-3543-2
  • Electronic_ISBN
    978-1-4244-3544-9
  • Type

    conf

  • DOI
    10.1109/INEC.2010.5424979
  • Filename
    5424979