DocumentCode
1669287
Title
Concurrent bug patterns and how to test them
Author
Farchi, Eitan ; Nir, Yarden ; Ur, Shmuel
Author_Institution
Verification Technol. Dept., IBM Haifa Res. Lab., Israel
fYear
2003
Abstract
We present and categorize a taxonomy of concurrent bug patterns. We then use the taxonomy to create new timing heuristics for ConTest. Initial industrial experience indicates that these heuristics improve the bug finding ability of ConTest. We also show how concurrent bug patterns can be derived from concurrent design patterns. Further research is required to complete the concurrent bug taxonomy and formal experiments are needed to show that heuristics derived from the taxonomy improve the bug finding ability of ConTest.
Keywords
multi-threading; object-oriented programming; program debugging; program testing; ConTest; bug finding ability; concurrent bug patterns; concurrent bug taxonomy; concurrent design patterns; heuristics; timing heuristics; Computer bugs; Computer languages; Interleaved codes; Java; Libraries; Sequential analysis; Software design; Taxonomy; Testing; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Parallel and Distributed Processing Symposium, 2003. Proceedings. International
ISSN
1530-2075
Print_ISBN
0-7695-1926-1
Type
conf
DOI
10.1109/IPDPS.2003.1213511
Filename
1213511
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