DocumentCode
1669369
Title
A study of field electron emission from carbon nanoclusters
Author
Fursey, G.N. ; Petrick, V.I. ; Novikov, D.V. ; Kotcheryzhenkov, A.V.
Author_Institution
Surface Phys. & Electron. Res. Centre, Telecommun. State Univ., St. Petersburg, Russia
fYear
2005
Firstpage
276
Lastpage
277
Abstract
The present work is devoted to the investigation of the characteristics of field emission from carbon nanoclusters (nanotubes, nanodiamonds and their composites) produced by cold destruction from natural graphite. Field emission microscopy and scanning electron microscopy were used to study the structure of the emitting surface. It was shown from the field emission image that this structure has high density of emission centers of approximately equal efficiency. Also, the field emission current varies with electric field, observed from current-voltage characteristics, in accordance with the Fowler-Nordheim law. Investigations of the emission properties of carbon nanoclusters confirmed that field emission from these materials takes place in electric fields more than two orders of magnitude lower than in metals and semiconductors. The current-voltage characteristics investigated in a wide range of currents (4 orders of magnitude) give a positive evidence that the mechanism of electron emission from these materials is linked to tunneling emission. No clear interpretation exists at the moment of the extremely low threshold field for the electron emission from carbon nanoclusters.
Keywords
carbon nanotubes; composite materials; diamond; electron field emission; scanning electron microscopy; C; Fowler-Nordheim law; carbon nanoclusters; composites; current-voltage characteristics; electric field; field electron emission; field emission microscopy; nanodiamonds; nanotubes; scanning electron microscopy; Carbon dioxide; Carbon nanotubes; Cathodes; Current-voltage characteristics; Electron emission; Mechanical factors; Microelectronics; Nanostructures; Organic materials; Physics;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International
Print_ISBN
0-7803-8397-4
Type
conf
DOI
10.1109/IVNC.2005.1619593
Filename
1619593
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