Title :
DRC-BASED SELECTION OF OPTIMAL PROBING POINTS FOR CMIP-INTERNAL MEASUREMENTS
Author :
Scharf, R. ; Kuntzsch, C. ; Helmreich, K. ; Wolz, W. ; Muller-Glaser, K.D.
Keywords :
Area measurement; Circuit synthesis; Circuit testing; Crosstalk; Electron beams; Guidelines; Integrated circuit measurements; Passivation; Semiconductor device measurement; Wire;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527908
