Title :
Medium-Large Induction Machines Starting Currents: Scaling Accuracy & Saturation Uncertainties
Author :
Arshad, Waqas M. ; Kanerva, Sami ; Bono, Silvia ; Menescardi, Massimo ; Persson, Holger
Author_Institution :
ABB Corp. Res., Vasteras
Abstract :
Accuracy levels of different scaling procedures for starting current measurements are addressed through statistical analysis of locked-rotor tests involving hundreds of medium- large induction machines. This is done so as to ascertain the confidence level of predicted full-voltage starting currents from reduced-voltage factory measurements, a necessity for motors with strict tolerance on proven starting current level. It is shown that for traditional scaling methods employing measurements only, this accuracy level is 88-90% for scaling step from 0.6 to 1.0 per unit voltage. It is shown that this figure could be raised to 95-97% through a novel method that also utilizes FEM simulations for each individual test voltage. The differences between FEM and measurements are documented and utilized for correcting the full-voltage FEM simulation. Further, the use of FEM is shown to help in the understanding of the causes and locations of measured voltage-dependent saturation uncertainties. The region (end-core, overhang or main core) that contributes the most to saturation uncertainties is shown to be identifiable through origin/parametric dependencies, leading to better product understanding and more reliable scaling methods in future.
Keywords :
asynchronous machines; electric current measurement; finite element analysis; statistical analysis; tolerance analysis; FEM simulations; locked-rotor tests; medium-large induction machines; starting current measurements; statistical analysis; tolerance; traditional scaling methods; Current measurement; Induction machines; Induction motors; Production facilities; Reluctance motors; Rotors; Surges; Testing; Uncertainty; Voltage;
Conference_Titel :
Industry Applications Conference, 2007. 42nd IAS Annual Meeting. Conference Record of the 2007 IEEE
Conference_Location :
New Orleans, LA
Print_ISBN :
978-1-4244-1259-4
Electronic_ISBN :
0197-2618
DOI :
10.1109/07IAS.2007.343