DocumentCode :
1669717
Title :
Field emission from multiwall carbon nanotubes prepared by electrodeposition without the use of a dispersant
Author :
Lyth, S.M. ; Oyeleye, F. ; Curry, R.J. ; Silva, S.R.P. ; Davis, J.
Author_Institution :
Adv. Technol. Inst., Surrey Univ., Guildford, UK
fYear :
2005
Firstpage :
304
Lastpage :
305
Abstract :
Preparation and field emission properties of multiwall carbon nanotube (MWNT):nickel (Ni) composite are presented. MWNT:Ni composite is deposited without the use of a dispersant by placing the plating solution in a sonic bath for 15 minutes before electrodeposition. Electrochemical measurements are conducted using a μAutolab computer controlled potentiostat with a three-electrode configuration and typical cell volume of 10 cm3. Scanning electron microscopy is used to image the resulting electrodeposits. Strong adhesion is observed between nickel coated nanotubes and the substrate surface. The substrates are subjected to field emission characterisation, where emission current is recorded as a function of macroscopic electric field at a vacuum of around 10-6 mbar. Threshold fields of the order 20 V/μm are observed. It is expected that by altering the deposition conditions, much lower threshold fields would be observed.
Keywords :
adhesion; carbon nanotubes; electrodeposits; electroplating; field emission; nanocomposites; nickel; scanning electron microscopy; μAutolab computer controlled potentiostat; 10E-6 mbar; 15 min; C-N; MWNT:Ni composite; adhesion; cell volume; deposition conditions; dispersant; electrochemical measurement; electrodeposition; emission current; field emission properties; macroscopic electric field; multiwall carbon nanotubes; nickel coated nanotubes; plating solution; scanning electron microscopy; sonic bath; substrate surface; three-electrode configuration; threshold fields; Carbon nanotubes; Coatings; Electrodes; Electronic mail; Nanoelectronics; Nickel; Spirals; Volume measurement; Wire; Wounds;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International
Print_ISBN :
0-7803-8397-4
Type :
conf
DOI :
10.1109/IVNC.2005.1619607
Filename :
1619607
Link To Document :
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