DocumentCode :
1669816
Title :
Synthesis and characterization of ultrathin single-crystalline cerium oxide nanorods
Author :
Yang, Yefeng ; Jin, Yizheng ; Ye, Zhizhen ; Tu, Yao ; Wang, Qingling
Author_Institution :
Dept. of Mater. Sci. & Eng., Zhejiang Univ., Hangzhou, China
fYear :
2010
Firstpage :
1112
Lastpage :
1113
Abstract :
We report a facile solution-based synthetic route to high-quality ultrathin cerium oxide nanorods with diameters of ~1.3 nm. High resolution transmission electron microscopy studies revealed that the nanorods were single-crystalline and grew along the [100] direction. The powder X-ray diffraction pattern of the final products indicated a cubic fluorite structure. The optical properties of the cerium oxide nanorods were explored by UV/Vis absorption and photoluminescence (PL) measurements at room temperature. The absorption edge of the ultrathin nanorods was obviously blue-shifted with respect to that of the bulk, suggesting the presence of size confinement resulted from the molecular-scale dimension of the nanorods. The current work is of interest for developing UV blocking and shielding materials, and would open up new opportunities for fundamental studies in the field of ultrathin nanorods and nanowires.
Keywords :
X-ray diffraction; cerium compounds; crystal structure; nanorods; nanowires; optical properties; transmission electron microscopy; ultraviolet spectra; visible spectra; CeO2; UV-Vis absorption; absorption edge; cerium oxide nanorods; cubic fluorite structure; facile solution; high resolution transmission electron microscopy; molecular-scale dimension; nanowires; optical properties; photoluminescence; powder X-ray diffraction pattern; size confinement; temperature 293 K to 298 K; ultrathin single crystalline; Cerium; Electromagnetic wave absorption; Electron optics; Nanowires; Optical diffraction; Photoluminescence; Powders; Temperature measurement; Transmission electron microscopy; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
Type :
conf
DOI :
10.1109/INEC.2010.5425007
Filename :
5425007
Link To Document :
بازگشت